Editorial Team

Tarek Sobh, University of Bridgeport,USA

Keyanoush Sadeghipour, Temple University, USA.
Mohammad Karim, Old Dominion University, USA.
Bruno Siciliano, Univesita degli Studi di napoli Federico II, Italy
Nariman Sepehri, The University Of Manitoba, Canada
Sadiq M. Sait, King Fahd University, Saudi Arabia
Angel Pobil, Jaume-I University, Spain
Luu Pham, Pitney Bowes,USA
ElSayed Orady, University of Michigan, Dearborn
Saeid Nahavandi, School Of Engineering & Technology, Australia
Heikki N. Koivo, Helsinki University of Technology, Finland
Mohamed Kamel, University of Waterloo, Canada
Junling (Joyce) Hu, University of Bridgeport,USA
Lawrence Vincent Hmurcik, University of Bridgeport,USA, United States
Hassan A. Heba, Cairo University, Egypt
Navarun Gupta, University of Bridgeport,USA
Angela Di Febbraro, Politecnico Di Torino, Italy
Aydan Erkmen, Middle East Technical University, Turkey
John Billingsley, University of Southern Queensland, Australia
Essam Badreddin, Univ of Mannheim, Germany
Giua Alessandro, Dip. di Ingegneria Elettrica ed Elettronica, Italy